ZEISS (LABLE) (Class 9)

The trademark application number 975129 is currently marked as "Registered" in the official trademark registry.

The trademark application number 975129 is owned by CARL ZEISS AG.

Trademark application number 975129 is filed under Class 9, which relates to the specified goods and services.

Yes, trademark application number 975129 was published in Journal No. 1328.

Trademark application number 975129 relates to "SCIENTIFIC APPARATUS AND INSTRUMENTS FOR RESEARCH IN LABORATORIES AND FOR USE IN LABORATORIES, SURVEYING, PHOTOGRAPHIC, CINEMATOGRAPHIC, OPTICAL, MEASURING, SIGNALLING AND CHECKING APPARATUS AND INSTRUMENTS, DATA PROCESSING EQUIPMENT, COMPUTERS, ELECTRIC, ELECTROTECHNIC AND ELECTRONIC APPARATUS AND INSTRUMENTS (AS COVERED BY CLASS 9); TELESCOPES, BINOCULARS, FIELD-GLASSES, TELESCOPE SPECTACLES, HUNTING BINOCULARS, HUNTING RIFLESCOPES, THEATRE GLASSES, RIFLESCOPES, SPECTACLE FRAMES, SPECTACLE LENSES, POLARIZATION SPECTACLES, CONTACT LENSES, MAGNIFIERS, MAGNIFYING SPECTACLES, PROTECTIVE EYE WEAR INCLUDING LASER PROTECTIVE EYE WEAR, LENGTH MEASURING APPARATUS, CENTER THICKNESS METERS, THREE-COORDINATE MEASURING MACHINES, ROTARY TABLES FOR COORDINATE MEASURING, DIFFERENTIAL HEIGHT MEASURING INSTRUMENTS, DISTANCE MEASURING INSTRUMENTS INCLUDING LASER DISTANCE METERS, ANGLE MEASURING INSTRUMENTS, COMPUTER PROGRAMMES, ANALYSING SYSTEMS FOR PHOTOGRAMMETRY, INTERPRETATION INSTRUMENTS FOR PHOTOGRAMMETRY, SURVEILLANCE CAMERAS, PHOTO-FLIGHT APPARATUS, REDRESSMENT INSTRUMENTS FOR PHOTOGRAMMETRY, GEODETIC INSTRUMENTS, CARTOGRAPHIC INFORMATION SYSTEMS, MAP REVISIONS PLOTTERS, RECONNAISSANCE CAMERAS, COPIERS FOR PHOTOGRAMMETRY, AERIAL ANALYSING INSTRUMENTS, AERIAL MAPPING CAMERAS, AERIAL SURVEY CAMERAS, SKETCHMASTERS, LEVELS, THEODOLITES, ILLUMINATORS FOR MICROSCOPES, MICROSCOPES OF ALL KINDS, DISCUSSION BRIDGES FOR MICROSCOPES, ROTARY STAGES FOR MICROSCOPES, DARKFIELD ACCESSORIES FOR MICROSCOPES, INTERFERENCE SYSTEMS FOR MICROSCOPES, CONDENSERS FOR MICROSCOPES, CO-OBSERVATION ATTACHMENTS FOR MICROSCOPES, DRAWING ATTACHMENTS FOR MICROSCOPES, ASPHERICAL AND ASTRONOMICAL OPTICS, ASTROGRAPHS, ASTROGRAPHIC OBJECTIVES, PHOTOGRAPHIC OBJECTIVES, SEMICONDUCTOR OBJECTIVES, OBJECTIVES FOR MICROSCOPES, ATTACHMENT LENSES, LENS CARRIERS, LENS SHUTTERS, ASTRONOMICAL INSTRUMENTS, ATOMIC ABSORPTION INSTRUMENTS, AUTOCOLLIMATORS, DIFFRACTION GRATINGS, DIFFRACTIONS OPTICS, CELOSTATS, REFRACTORS, ELECTRON MICROSCOPES, PRISMS, SPECTROMETERS, TACHEOMETERS, TECHNOSCOPES, ABSORBANCE METERS AND RECORDERS, PHOTOMETERS, STEREOSCOPES, FILTERS FOR OPTICAL APPARATUS, FLUOROMETERS, GRATINGS FOR X-RAY MONOCHROMATORS, GLASS METERS, GLASS SCALES, PLANETARIA, PROJECTORS FOR PLANETARIA, INTERFEROMETERS, INVERTOSCOPES, POLARISATION AND INTERFERENCE FILTERS, CERATOMETERS, COLPOSCOPES, CORONOGRAPHS, POLARIMETERS, CRYSTAL COMPONENTS AND SYNTHETIC CRYSTALS ALL FOR OPTICAL LENSES, PERIMETERS, COLORIMETERS, LASER PROTECTION FILTERS, LASERS FOR INDUSTRIAL PURPOSES, MERIDIAN CIRCLES, SPECTROSCOPES, MICRO HARDNESS TESTERS, MICROSCOPE CAMERAS, MONOCHROMATORS, NIGHT SCOPES, OCULARS, OPTICAL CRYSTAL, OPTICAL PLUMMETS, OPTICAL MIRRORS, ORTHOPROJECTORS, INSTRUMENTS FOR MEASURING SURFACES, REFLECTORS, PROFILOMETERS, X-RAY CAMERAS, X-RAY OPTICS, FOCIMETERS, SUN-TRACKING TELESCOPES, SOLAR SIMULATORS, SPECTRUM LAMPS, STEREOPANTOMETERS, STAR SENSORS, STAR SIMULATORS, THERMOGRAPHIC SYSTEMS, SPACE QUALIFIED OPTICS, LASER SCALES; PARTS OF THE AFOREMENTIONED GOODS.".